A Complete Method for Environmental Samples by Simultaneous Axially Viewed ICP- OES following US EPA Guidelines Authors

نویسندگان

  • Scott Bridger
  • Mike Knowles
چکیده

The Vista instrument has a number of distinct advantages over similar ICP-OES systems. Firstly, the VistaChip is the only single Charge Coupled Device (CCD) that allows full coverage of the spectrum from 165-785nm, with a pixel processing speed of 1 MHz and exceptional anti-blooming properties. These features allow both trace level analytes and major analytes to be determined in the same measurement. Secondly, the RF robustness of the Vista ICP-OES permits the analysis of difficult samples, up to 5% total dissolved solids, using an axially viewed plasma. Finally, the Cooled Cone Interface (CCI) of the axially viewed Vista eliminates the cooler tail of the plasma, reducing Easily Ionizable Element (EIE) interferences and maximizing linear dynamic range. The CCI consists of a cooled nickel cone with a large orifice at its tip, positioned to view the optimum region of the axial plasma.

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تاریخ انتشار 2010