Parametric fault model for RTD based Threshold Logic Gates
نویسندگان
چکیده
One of major implementations of Linear Threshold Gate (LTG) is via resonant tunneling diodes (RTD). The functionality of this threshold logic gate greatly depends on the parameters of the RTD and parametric faults impact its functionality. A suitable fault model for Combinational Threshold Logic gates is presented. A methodology is also developed to generate test patterns that detect these parametric faults. Key-Words: Threshold logic, Linear threshold gate, Resonant Tunneling Diode, RTD parameters, MOBILE, parametric fault.
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