NIST Backscattering-Correction-Factor Database for Auger Electron Spectroscopy

نویسندگان

  • A Jablonski
  • C J Powell
چکیده

ii __________________ The National Institute of Standards and Technology (NIST) uses its best efforts to deliver a high quality copy of the database and to verify that the data contained therein have been selected on the basis of sound scientific judgment. However, NIST makes no warranties to that effect, and NIST shall not be liable for any damage that may result from errors or omissions in the database. Certain trade names and other commercial designations are used in this work for the purpose of clarity. In no case does such identification imply endorsement by the National Institute of Standards and Technology nor does it imply that the products or services so identified are necessarily the best available for the purpose.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Development of the web-based NIST X-ray Photoelectron Spectroscopy (XPS) Database

The first Web-based version of the NIST X-ray Photoelectron Spectroscopy Database (XPSDB) is described. The current database, built from a relational database management system (RDBMS), contains critically evaluated data with over 19,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines. It is available free of charge to the pu...

متن کامل

Carbon nitride materials synthesized by Ion-assisted pulsed laser deposition

Synthesis of carbon nitride has been an important topic in materials science since 1993. Ion-assisted pulsed laser deposition is proven to be a good method to deposit carbon nitride thin films. Both amorphous and crystal -C3N4 layers can be deposited on many substrates. A standard experimental set-up comprises a pulsed KrF excimer laser (wavelength 248 nm, duration ∼30 ns) that is used to ablat...

متن کامل

The Potentiodynamic Behavior of Copper in NaCI Solutions Studied by Auger and Photoelectron Spectroscopy

The potentiodynamic behaviour of copper in brine solutions was studies. Auger and photo-electron spectroscopy were used together with electrochemical methods. It is demostrated that the passivation observed in potentiodynamic curves is due to a surface film formation on a copper electrode. It is concluded that this film must be copper (I) chloride in nature. Effect of different factors on poten...

متن کامل

Interrelationship of interdiffusion and microstructure in thin-film systems

Simultaneous fitting of independently measured sputter-depth profiles of intensities of Auger electrons or photoelectrons from different Auger transitions (AES) or core levels (XPS) is shown to increase the reliability of the thus determined concentration-depth profiles in diffusion-annealed thin film systems, as compared to the usually applied single profile fitting. In this context an extensi...

متن کامل

New Approach for Correction of Distortions in Spectral Line Profiles in Auger Electron Spectroscopy

A new deconvolution method for Auger electron spectroscopy is presented. This method is based on a non-linear least squares minimizing routine (Levenberg-Marquardt) and global approximation using splines, solving many of the drawbacks inherent to the Van Cittert and Fourier transform based deconvolution methods. The deconvolution routine can be run on a personal computer. The application of thi...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2015