Lifetime Yield Optimization: Towards a Robust Analog Design for Reliability

نویسندگان

  • Xin Pan
  • Helmut Graeb
چکیده

A prototype based on industrial tools will be presented to analyze and optimize the lifetime yield of analog circuits, where both parameter variations from manufacture process and parameter lifetime degradations due to NBTI and HCI effects are considered [1]. A robust analog design is thus achieved tolerant of both effects.

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تاریخ انتشار 2010