An in situ SEM-FIB-based method for contrast enhancement and tomographic reconstruction for structural quantification of porous carbon electrodes.

نویسندگان

  • Santhana K Eswara-Moorthy
  • Prasanth Balasubramanian
  • Willem van Mierlo
  • Jörg Bernhard
  • Mario Marinaro
  • Margret Wohlfahrt-Mehrens
  • Ludwig Jörissen
  • Ute Kaiser
چکیده

A new in situ Scanning Electron Microscope-Focused Ion Beam-based method to study porous carbon electrodes involving Pt filling of pores from gaseous precursors has been demonstrated to show drastically improved image contrast between the carbon and porous phases when compared with the Si-resin vacuum-impregnation method. Whereas, the latter method offered up to 20% contrast, the new method offers remarkably higher contrast (42%), which enabled fast semi-automated demarcation of carbon boundaries and subsequent binarization of the images with very high fidelity. Tomographic reconstruction of the porous carbon electrode was then obtained from which several morphological parameters were quantified. The porosity was found to be 72±2%. The axial and radial tortuosites were 1.45±0.04 and 1.43±0.04, respectively. Pore size, which is defined to be the distance from the medial axis of the pore to the nearest solid boundary, was quantified. Average pore size determined from the pore size distribution was 90 nm and the corresponding 1 sigma ranges from 45 to 134 nm. Surface-to-volume ratio of the carbon phase was 46.5 µm(-1). The ratio of total surface area to the total volume of electrode including pores (i.e., specific surface area) was 13 µm(-1).

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عنوان ژورنال:
  • Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

دوره 20 5  شماره 

صفحات  -

تاریخ انتشار 2014