Advanced Plasma Processing: Etching, Deposition, and Wafer Bonding Techniques for Semiconductor Applications
نویسندگان
چکیده
Plasma processing techniques are one of the cornerstones of modern semiconductor fabrication. Low pressure plasmas in particular can achieve high radical density, high selectivity, and anisotropic etch profiles at low temperatures and mild voltages. This gentle processing environment prevents unwanted diffusion and degradation of materials due to heat and lattice damage from ion bombardment. Plasma treatments have a minimal effect on existing wafer structure, which is a key requirement for large scale integration schemes such as CMOS. In addition, recent progress in plasma-assisted wafer bonding has demonstrated low temperature, low pressure recipes utilizing O2 plasma surface treatment for joining dissimilar semiconductor materials, such as silicon (Si) and indium phosphide (InP) (Fang et al., 2006). In this chapter, we will cover the applications of plasmas to etching and depositing materials, as well as novel processing modalities such as surface treatments in preparation for wafer bonding. All these processes rely on the inductively coupled plasma reactive ion etcher (ICP-RIE) used in the integrated electronics industry, which we will explain in detail. The unique chemical environment of ICP-RIE generated plasmas gives process engineers new capabilities that are not found in other techniques that are compatible with existing architecture requirements. After an overview of the principles of the ICP-RIE, we will describe our work in novel mask materials and processing conditions in plasma etching and deposition. High aspect ratio nanopillars have recently been fabricated using this technique, with features as small as 22 nm etched over 1.25 μm deep. In particular, our use of Al2O3 as a mask material along with cryogenic wafer temperatures has demonstrated to increase the etch selectivity of silicon over mask to more than 5000:1, enabling ultrathin masks for nanoscale pattern transfer (Henry et al., 2009a). After patterning, in situ deposition can encapsulate these structures in preparation for further processing. 5
منابع مشابه
Control in Semiconductor Wafer Manufacturing
A semiconductor wafer undergoes a wide range of processes before it is transformed from a bare silicon wafer to one populated with millions of transistor circuits. Such processes include Physical or Chemical Vapor Deposition, (PVD, CVD), Chemical-Mechanical Planarization (CMP), Plasma Etch, Rapid Thermal Processing (RTP), and photolithography. As feature sizes keep shrinking, process control pl...
متن کاملCarrier techniques for thin wafer processing
Three different types of carrier techniques have been investigated and developed: thermal release tapes, solvable thermoplastic glue layer and mobile electrostatic carrier. These carriers were applied for manufacture of ultra-thin RFID chips, 12 μm thin CMOS image sensors and to a new process sequence that enables the formation of solder balls at the front side of an already thinned device wafe...
متن کاملReal-time Optical Therrnornetry During Semiconductor ProcessinLg
The optic,al techniques used to monitor the temperature of wafers during semiconductor processing are surveyed. The physical principles underlying each method are described. Applications of each oiptical diagnostic are presented, along with the strengths and weaknesses of the probe. Most of these optical diagnostics have been implemented in research reactors to monitor wafer temperature during ...
متن کاملUsing Neural Networks To Control The Process of Plasma Etching and Deposition
Neural architectures are proposed to model and control plasma etching and deposition processes in semiconductor wafer manufacturing. Static and dynamic neural networks are used to develop plant models and inverse models. A single-hidden layer feedforward neural network model learns to identify the system’s input-output relationship. Another single-hidden layer feedforward neural controller lear...
متن کاملAluminium Surface Activation Using Atmospheric-pressure Plasma
Contact angles and Attenuated Total Reflection FTIR measurements were performed to study plasma activation of aluminium surface in air atmosphere using Diffuse Coplanar Surface Barrier Discharge plasma source. Two types of aluminium surfaces were used: i) industrially produced bulk aluminium samples; ii) thermally evaporated thin films of aluminium on glass (sets of 400 nm and 2 μm thickness). ...
متن کامل