THE DETERMINATION OF THICKNESS AND OPTICAL CONSTANTS FOR PbSe FILM FROM IR REFLECTANCE SPECTRA
نویسنده
چکیده
The transmittance values measured in IR reflection-absorption (RA) spectra were used to determine the optical constants of dielectric films laid on solid substrates. When the recorded spectra show interference fringes, one can determine the film thickness. The PbSe film thickness was obtained by interpreting the interference fringes from the reflexion-absorption IR spectra recorded at two different incidence angles. In order to obtain the optical constants of PbSe films laid on steel we used dispersion analysis. The dispersion analysis offers the advantage of processing a large volume of data.
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