Analog Testability Analysis and Fault Diagnosis using Behavioral Modeling
نویسندگان
چکیده
This paper presents an efficient strategy for testability analysis and fault diagnosis of analog circuits using behavioral models. A key contribution is a new algorithm for determining analog testability. Experimentally, we determined the testability and faults of a fabricated 10 bit digital-to-analog converter modeled using the analog hardware description language, Cadence-AHDL. Also, we applied the testability analysis at the circuit level using SPICE sensitivity analysis.
منابع مشابه
Research on k-fault diagnosis and testability in analog circuit
Fault diagnosis is very important for development and maintenance of safe and reliable electronic circuits and systems. Many k-fault diagnosis methods were put forward such as branch method, node method, loop method, mesh method, cut set method. But the tolerance effect as well as non-linear problems exist and are difficult to deal with. A fault diagnosis method for analog circuit is proposed i...
متن کاملSwitch-Level Fault Coverage Analysis for Switched-Capacitor Systems
An approach to test optimization in switched-capacitor systems based on fault simulation at switch-level is presented in this paper. The advantage of fault simulation at this granularity level is that it facilitates test integration as early as possible in the design of these systems. Due to their mixed-signal nature, both catastrophic and parametric faults must indeed be considered for test op...
متن کاملFinding Ambiguity Groups in Low Testability Analog Circuits
This paper discusses a numerically efficient approach to identify complex ambiguity groups for the purpose of analog fault diagnosis in low-testability circuits. The approach presented uses a numerically efficient QR factorization technique applied to the testability matrix. Various ambiguity groups are identified. This helps to find unique solution of fault diagnosis equations or identifies wh...
متن کاملDetermination of an Optimum Set of Testable Components in the Fault Diagnosis of Analog Linear Circuits
A procedure for the determination of an optimum set of testable components in the fault diagnosis of analog linear circuits is presented. The proposed method has its theoretical foundation in the testability concept and in the canonical ambiguity group concept. New considerations relevant to the existence of unique solution in the k-fault diagnosis problem of analog linear circuits are presente...
متن کاملFault Diagnosis in Mixed-Signal Low Testability System
This paper describes a new approach for fault diagnosis of analog multi-phenomenon systems with low testability. The developed algorithms include identification of ambiguity groups, fault diagnosis methodology and solving low testability equations. Our aim is to identify a minimum number of faulty parameters that satisfy fault equations called a minimum form solution. An algorithm to find a min...
متن کامل