Stochastic Testing Method for Transistor-level Uncertainty Quantification
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چکیده
Design and fabrication uncertainties have become an important issue in nano-scale integrated circuit design. Such uncertainties are typically randomly distributed, as described by probability density functions extracted from measurements. Such device-level uncertainties can propagate to the upper circuit level, leading to significant variations in circuit performances (such as power dissipation, small-signal gain, clock frequency, etc.) As a result, many performance metrics become uncertain in today’s IC design. Therefore, it is highly desirable to develop efficient electronic design automation (EDA) tools to capture the variations in various design levels.
منابع مشابه
Uncertainty quantification for integrated circuits and microelectrornechanical systems
Uncertainty quantification has become an important task and an emerging topic in many engineering fields. Uncertainties can be caused by many factors, including inaccurate component models, the stochastic nature of some design parameters, external environmental fluctuations (e.g., temperature variation), measurement noise, and so forth. In order to enable robust engineering design and optimal d...
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