Beam Profile Measurement at 30 GeV Using Optical Transition Radiation
نویسندگان
چکیده
We present results of measurements of spot size and angular divergence of a 30 GeV electron beam though use of optical transition radiation (OTR). The OTR near field pattern and far field distribution are measured as a function of beam spot size and divergence at wavelengths of 441, 532, and 800 nm, for both the single and double foil configurations. Electron beam spot sizes of 50μm rms have been resolved, demonstrating the utility of OTR for measurement of small beam spot sizes of high energy (30 GeV) electron beams. Two-foil interference was clearly observed and utilized to extract electron beam angular divergences of ∼ 100μrad.
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تاریخ انتشار 1999