Scattering of roughened TCO films – modeling and measurement
نویسندگان
چکیده
The scattering properties of transparent conductive oxide (TCO) films into dielectric and semiconductor surrounding media are modeled and compared to experiment. The new approach is not only valid for smooth optical films but also for films with enhanced roughness in order to generate light trapping structures for thin film solar cells. ©2010 Optical Society of America. OCIS codes: (310.0310) thin films, (350.6050) solar energy, (290.0290) scattering, (240.5770) optics at surfaces, roughness
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