Active Wavelet Networks for Face Alignment

The active appearance model (AAM) algorithm has proved to be a successful method for face alignment and synthesis. By elegantly combining both shape and texture models, AAM allows fast and robust deformable image matching. However, the method is sensitive to partial occlusions and illumination changes. In such cases, the PCA-based texture model causes the reconstruction error to be globally spread over the image. In this paper, we propose a new method for face alignment called active wavelet networks (AWN), which replaces the AAM texture model by a wavelet network representation. Since we consider spatially localized wavelets for modeling texture, our method shows more robustness against partial occlusions and some illumination changes.