Testing Second-Order Delta-Sigma Modulators Using Pseudo-Random Patterns
نویسنده
چکیده
Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. This type of modulator requires high-resolution test stimulus, which is difficult to generate. This paper proposes a novel and robust technique to determine the performance of the modulator by characterizing its key parameters using a pseudo-random pattern sequence. This technique is suitable for BIST application since a pseudorandom sequence can be generated on-chip using LFSR. Numerical simulation results show that this technique is capable of identifying parameters that affect the performance of a second-order delta-sigma modulator ADC.
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