Dedicated Autonomous Scan-Based Testing (DAST) for Embedded Cores
نویسندگان
چکیده
The complexity of today’s chips is such that relying solely upon external ATE resources is insufficient for scan test. In this work, we develop the concept of dedicated autonomous scan-based testing (DAST) by proposing a scheme that introduces hierarchy and separates the functionality of ATE resources into two distinctive classes: a) test data communication, and b) test data control and observation. To simplify the ATE for embedded digital core testing, we propose transferring ATE test data control/observation functions to one or more Embedded Autonomous Sequencers (EAS) dedicated to single or multiple embedded cores of an SoC. We present implementation results of our DAST methodology when applied to a number of SoC benchmarks.
منابع مشابه
An Embedded Autonomous Scan-Based Results Analyzer (EARA) for SoC Cores
Telephone: b 1 – 604 – 822 5333, c 1 – 604 – 822 6936 Abstract Relying solely upon external ATE resources for scan test in complex SoC designs is increasingly difficult. In this work, we develop the concept and implementation of an Embedded Autonomous Results Analyzer (EARA) to be used in our modified Dedicated Autonomous Scan-based Testing (DAST) methodology. DAST introduces hierarchy and sepa...
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