Information content of the near-field I: two-dimensional samples
نویسندگان
چکیده
Richard A. Frazin Department of Electrical and Computer Engineering University of Illinois at Urbana-Champaign, Urbana, IL 61821 David G. Fischer NASA Glenn Research Center, MS110-3, 21000 Brookpark Rd. Cleveland, OH 44135 P. Scott Carney Department of Electrical and Computer Engineering, The Beckman Institute for Advanced Science and Technology, and The Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61821
منابع مشابه
Information content of the near field: two-dimensional samples.
Limits on the effective resolution of many optical near-field experiments are investigated. The results are applicable to variants of total-internal-reflection microscopy (TIRM), photon-scanning-tunneling microscopy (PSTM), and near-field-scanning-optical microscopy (NSOM) in which the sample is weakly scattering and the direction of illumination may be controlled. Analytical expressions for th...
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