High structural order in thin films of the organic semiconductor diindenoperylene
نویسندگان
چکیده
We report extraordinary structural order along the surface normal in thin films of the organic semiconductor diindenoperylene ~DIP! deposited on silicon–dioxide surfaces. Cross-sectional transmission electron microscopy ~TEM!, noncontact atomic force microscopy ~NC–AFM!, as well as specular and diffuse x-ray scattering measurements were performed to characterize thin films of DIP. Individual monolayers of essentially upright-standing DIP molecules could be observed in the TEM images indicative of high structural order. NC–AFM images showed large terraces with monomolecular steps of '16.5 Å height. Specular DIP Bragg reflections up to high order with Laue oscillations confirmed the high structural order. A semi-kinematic fit to the data allowed a precise determination of the oscillatory DIP electron density rel.,DIP(z). The mosaicity of the DIP thin films was obtained to be smaller than 0.01°. © 2002 American Institute of Physics. @DOI: 10.1063/1.1508436#
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