Optimum Test Sequence Generation from Estelle Specifications

نویسندگان

  • Mariusz A. Fecko
  • Umit Uyar
  • Paul D. Amer
  • Adarshpal S. Sethi
چکیده

The recent research results from the Protocol Engineering Lab of the University of Delaware in minimum-length test generation based on Estelle speci cations are summarized. The methods use models restricting the number of self-loops to be consecutively traversed for each state, and utilizing semicontrollable interfaces of the IUT to increase the number of testable transitions. The initial results show that test sequences can be successfully generated for real-life Estelle speci cations, such as MIL-STD 188-220B. The test sequences are free of interruptions due to unexpected timeouts. Also, the number of testable transitions is increased by 300%.

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تاریخ انتشار 1998