Partial Scan Design Methods Based on Internally Balanced Structure
نویسندگان
چکیده
| In this paper, we theoretically and experimentally show the e ectiveness of partial scan design based on internally balanced structure, which is a sequential circuit capable of generating tests with a combinational test generation algorithm. Moreover, we introduce a method of extended partial scan design, which replaces part of not only ipops by scan ipops but also wires by bypass ipops in a sequential circuit, and propose a method of extended partial scan design based on internally balanced structure. Experimental results for benchmark circuits show that the proposed partial scan design and extended partial scan design can be implemented with
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