ToF-SIMS studies of the oxidation of Fe by D2O vapour: comparison with XPS
نویسندگان
چکیده
The oxidation of iron (Fe) by water (D2O) vapour at low pressures and room temperature was investigated using time-of-flight (ToF) SIMS. The results supported those found previously using XPS and the QUASES program in that a duplex oxide structure was found containing a thin outer surface hydroxide (Fe(OD)2) layer over an inner oxide (FeO) layer. The extraordinary depth resolution of the ToF-SIMS profiles assisted in identifying the two phases; this resolution was achieved by compensation for surface roughness. A substantial concentration of deuterium was found in the subsurface oxide layer. This observation confirmed previous assessments that the formation of FeO was from the reaction of Fe(OD)2 with outward-diffusing Fe, leaving deuterium as a reaction product. Copyright 2005 John Wiley & Sons, Ltd.
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