Stability and sensitivity analysis of periodic orbits in Tapping Mode Atomic Force microscopy - Decision and Control, 1998. Proceedings of the 37th IEEE Conference on
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چکیده
In this paper, the most widely used mode of atomic force microscopy imaging where the cantilever is oscillated at its resonant frequency is studied. It is shown that the amplitude and the sine of the phase of the orbit vary linearly with respect to the cantilever-sample distance. Experiments conducted on a silicon cantilever agree with the theory developed.
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