Ferroelectric fatigue endurance of Bi4−xLaxTi3O12 thin films explained in terms of x-ray photoelectron spectroscopy

نویسندگان

  • A. Z. Simões
  • C. S. Riccardi
  • L. S. Cavalcante
  • E. Longo
  • J. A. Varela
  • D. W. Hess
چکیده

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تاریخ انتشار 2014