X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe

Single-crystal diffuse X-ray scattering was used to characterize radiation-induced defects in individual grains of a polycrystalline proton-irradiated Fe foil. The grains were probed with an intense 1 microm X-ray beam to demonstrate that both polycrystalline and micrometer-scale samples can be studied with single-crystal-like signal-to-noise. Scattering was measured with an X-ray-sensitive area detector, which measures intensity over a surface in reciprocal space. By scanning the X-ray energy, the intensity was measured over reciprocal-space volumes. Since the sample is not rotated, the real-space scattering volume does not change. Methods to minimize experimental artifacts arising from the use of an area detector are described.