Protein-Assembled Nanocrystal-Based Vertical Flash Memory Devices with Al2O3 Integration

نویسندگان

  • F. FERDOUSI
  • J. SARKAR
  • S. TANG
  • D. SHAHRJERDI
  • T. AKYOL
چکیده

This work presents vertical flash memory devices with protein-assembled PbSe nanocrystals as a floating gate and Al2O3 as a control oxide. The advantage of a vertical structure is that it improves cell density. Protein assembly improves uniformity of nanocrystals, which reduces threshold voltage variation among devices. The introduction of Al2O3 as a control oxide provided lower voltage/faster operation and hence less power consumption compared with the devices fabricated with SiO2. The integration of Al2O3 appeared to be compatible with the protein assembly approach. In conclusion, Al2O3 has the potential to become the high-k control oxide due to its relatively high electron/hole barrier heights, and high permittivity.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Metal Nanocrystal Memory With Pt Single- and Dual-Layer NC With Low-Leakage Al2O3 Blocking Dielectric

In this letter, we report metal nanocrystal (NC)-based Flash memory devices with single-layer (SL) and dual-layer (DL) Pt NCs as the storage element. The devices are fabricated using CMOS compatible process flow with optimized low-leakage high-k Al2O3 as the control dielectric. Large memory window (10 V for SL and 15 V for DL devices) is observed due to overerase, which increases the overall wi...

متن کامل

A wearable multiplexed silicon nonvolatile memory array using nanocrystal charge confinement

Strategies for efficient charge confinement in nanocrystal floating gates to realize high-performance memory devices have been investigated intensively. However, few studies have reported nanoscale experimental validations of charge confinement in closely packed uniform nanocrystals and related device performance characterization. Furthermore, the system-level integration of the resulting devic...

متن کامل

Nanocrystal Non-Volatile Flash Memory Devices: A Simulation Study

We have simulated the programming/erasing characteristics and studied the reliability aspects of silicon nanocrystal memory (NCM) cells Due to the charge storage in discrete nodes, NCM cells clearly show a very high robustness against gate and drain disturbs and, furthermore, they are negligibly impacted by SILC.

متن کامل

Technology for Self-Assembled Entities in Logic and Memory Units below the Lithography Limit

Discrete floating gates, nanocrystals or nitride traps, of Flash memory devices enable aggressive scaling of the tunneling oxide by relieving the total charge loss concern of the continuous floating gate [1]. However, a trade-off between the retention and program/erase (P/E) characteristics still remains. Nanocrystal memories with the direct tunneling oxide can still suffer serious retention de...

متن کامل

Nonvolatile Memory Based on Si Implanted Gate Oxides

The concept of a nanocrystal memory [1,2] has several attractive features. First, it overcomes limitations of current (Flash)-EEPROM technologies: higher endurance and lower voltages become possible enabling further scaling and memories of higher density. Second, the retention characteristics can be possibly tailored from DRAM-like to EEPROM-like memories by adjusting the cluster size and their...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2009