Reflecting at 30.4 and Antireflecting at 58.4 nm
نویسندگان
چکیده
We investigated how antireflection (AR) using thin film interference can be achieved in the EUV for multilayer mirrors. This may not been much investigated since AR is not usually needed. AR is not as straightforward as in the visible and neighboring frequencies for several reasons. No materials are entirely transparent in the EUV (indeed materials commonly used in the visible are among the most opaque). The optical constants are not known as well (particularly for compounds), and the antireflection layers can decrease the desired reflection from the multilayer at the “called for” energy. Incorporation of impurities can also be a problem. Nevertheless AR has a role to play in some circumstances. ©2007 Optical society of America OCIS codes: 310.1210 Antireflection; 340.7470 X-ray mirrors
منابع مشابه
The Optical Constants of Sputtered U and a-Si at 30.4 and 58.4 nm
Introduction Optical constants are used to compute the response of a material to light. Previously published optical constants for uranium and a-Si over portions of the extreme ultraviolet (EUV) are questionable. The optical constants of a-Si from peerreviewed literature are not consistent with optical constants calculated from the atomic scattering factors of crystalline Si. The optical consta...
متن کاملAntireflecting and polarizing transparent bilayer coating on absorbing substrates at oblique incidence.
متن کامل
Capped Mo/Si multilayers with improved performance at 30.4 nm for future solar missions.
Novel capping layer structures have been deposited on periodic Mo/Si multilayers to optimize reflectance at 30.4 nm. Design, deposition and characterization of such coatings are presented. Most of the structures proposed show improved performance with respect to standard Mo/Si multilayers and are stable over time. Reflectance at 121.6 nm and in the visible spectral range have been also tested t...
متن کاملThe Solar Radius in the EUV during the Cycle XXIII
Aims. To determine the solar transition region and coronal radius at EUV wavelengths and its time evolution during Solar Cycle XXIII. Methods. We use daily 30.4 and 17.1 nm images obtained by the Extreme Ultraviolet Imager (EIT) aboard the SoHO satellite and derive the solar radius by fitting a circle to the limb brightness ring. Results. The weighted mean of the temporal series gives (967′′.56...
متن کاملHigh repetition rate operation of saturated tabletop soft x-ray lasers in transitions of neon-like ions near 30 nm.
We report average powers exceeding 1 microwatt in laser transitions of Ne-like ions at wavelengths near 30 nm. Gain-saturated operation was obtained at a repetition rate of 5 Hz exciting solid targets with pump pulses of ~1 J energy and 8 ps duration impinging at grazing incidence of 20 degrees. Gain-length products of about 20 were obtained in the 30.4 nm and 32.6 nm transitions of Ne-like V a...
متن کامل