Circular BIST testing the digital logic within a high speed Serdes

نویسندگان

  • Graham Hetherington
  • Richard Simpson
چکیده

High Speed Serializer Deserializers (serdes) are traditionally tested using functional BIST. This paper presents an improved BIST for testing the digital part of a serdes using circular BIST.

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تاریخ انتشار 2003