An Empirical Study of the Effects of Incorporating Fault Exposure Potential Estimates into a Test Data Adequacy Criterion

نویسندگان

  • Wei Chen
  • Gregg Rothermel
  • Roland H. Untch
  • Jeffery von Ronne
چکیده

Wei Chen Department of Computer S ien e Oregon State University Corvallis, OR henwei s.orst.edu Gregg Rothermel Department of Computer S ien e Oregon State University Corvallis, OR grother s.orst.edu Roland H. Untch Computer S ien e Department Middle Tennessee State University Murfreesboro, TN unt h mtsu.edu Jeffery von Ronne Department of Information and Computer S ien e University of California { Irvine Irvine, CA jronne i s.u i.edu

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تاریخ انتشار 2000