Reliability Engineering in Rf Cmos

نویسندگان

  • Guido T. Sasse
  • Guido Theodor Sasse
چکیده

Dit proefschrift is goedgekeurd door de promotoren: Summary 125 Samenvatting 127 List of publications 129 Dankwoord 131 Chapter 1 Introduction 1.1 RF CMOS The use of mobile wireless communication systems is rapidly increasing. Electronics involved in these systems are typically referred to as RF electronics. RF stands for radio frequencies, a term covering all frequencies of the electromagnetic spectrum used for transmitting radio signals. It spans from a few Hz to 100's of GHz. When dealing with present-day mobile applications the frequencies involved typically range between ∼500 MHz and ∼ 5 GHz. For example the four frequency bands used for GSM communication throughout the world are located around 850, 900, 1800 and 1900 MHz. In electronics design the term RF is often used to describe only those frequencies at which design and measurement issues start to arise that are typical for the high frequencies used in mobile wireless communication systems. Throughout this thesis the term RF also reflects only these high frequencies; in chapter 2 the precise definition of RF as used in this thesis will be explained. The IC technologies involved in wireless systems operating at such high frequencies include GaAs, SiGe, Bipolar, BiCMOS and CMOS. In earlier years CMOS was not applicable for RF electronics, but through the efforts made in scaling CMOS technology, the RF performance of CMOS has increased significantly [1]. As a consequence CMOS has become the dominating technology used for mobile wireless applications, like it has already dominated logic applications, such as CPU's, for decades. When used in RF electronics, CMOS is often referred to as RF CMOS. The only part of mobile applications in which CMOS still does not dominate is the Power Amplifier (PA). This module is used in the transmitting end of a wireless communication system. In the PA an electromagnetic wave is generated carrying all information, such as speech or data, which is fed to an antenna. The information this wave carries must be read at the receiver end, such as the base-station of a GSM network, of the wireless communication system. For the information to be available at the receiver end, the power of this electromagnetic 1 2 1 Introduction

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Reliability Analysis of Corroded Reinforced Concrete Beams Using Enhanced HL-RF Method

Steel corrosion of bars in concrete structures is a complex process which leads to the reduction of the cross-section bars and decreasing the resistance of the concrete and steel materials. In this study, reliability analysis of a reinforced concrete beam with corrosion defects under the distributed load was investigated using the enhanced Hasofer-Lind and Rackwitz-Fiessler (EHL-RF) method base...

متن کامل

Announcing the Final Examination of Ekavut Kritchanchai for the degree of Doctor of Philosophy Time & Location: March 2, 2016 at 1:00 PM in HEC 450 Title: RF CIRCUIT DESIGNS FOR RELIABILITY AND PROCESS VARIABILITY RESILIENCE

Complementary metal oxide semiconductor (CMOS) radio frequency (RF) circuit design has been an ever-lasting research field. It has gained so much attention since RF circuits offer high mobility and wide-band efficiency, while CMOS technology provides the advantage of low cost and high integration capability. At the same time, CMOS device size continues to scale to the nanometer regime. Reliabil...

متن کامل

Optimizing Reliability Analysis of Mems Devices on an Hpc Setup Using Multi Scale Modeling

ion Scale Properties Nano CMOS 30-100nm Capacitance in CMOS RF MEMS 100-500nm Properties of antenna CNT 10-30 nm Conductance Although these tools have been successful in simulating the behavior of simple-function devices but fails when it goes to more complex areas because the physics developed cannot explain accurately all the properties, also they have not been as successful in simulating the...

متن کامل

An Enhanced HL-RF Method for the Computation of Structural Failure Probability Based On Relaxed Approach

The computation of structural failure probability is vital importance in the reliability analysis and may be carried out on the basis of the first-order reliability method using various mathematical iterative approaches such as Hasofer-Lind and Rackwitz-Fiessler (HL-RF). This method may not converge in complicated problems and nonlinear limit state functions, which usually shows itself in the f...

متن کامل

Extension in Submicron CMOS Technology

In modern CMOS technologies reliability issues limit the maximum operating voltage of transistors. This prevents the integration of efficient power amplifiers (e.g., audio or RF) since stacked devices are needed to prevent breakdown, which reduces efficiency. Transistor reliability is strongly related to operating voltages; higher voltages result in faster degradation and hence in lower reliabi...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2008