Visualization of single heavy atoms by dark field electron microscopy.
نویسندگان
چکیده
Dark field electronmicrographs of atoms of palladium, iodine, platinum, osmium, and uranium in model compounds have been obtained. Statistical analyses and a series of blind tests demonstrate the validity of the results. Moreover, optical density measurements of the images indicate that the observed relative scattering cross-sections of these atoms agree well with the theoretical cross-sections calculated from a Thomas-Fermi-Dirac model of the atom.
منابع مشابه
Phase contrast scanning transmission electron microscopy imaging of light and heavy atoms at the limit of contrast and resolution
Using state of the art scanning transmission electron microscopy (STEM) it is nowadays possible to directly image single atomic columns at sub-Å resolution. In standard (high angle) annular dark field STEM ((HA)ADF-STEM), however, light elements are usually invisible when imaged together with heavier elements in one image. Here we demonstrate the capability of the recently introduced Integrated...
متن کاملMethods for Scanning Transmission Electron Microscopy High Angle Annular Dark Field Based for Three Dimensional Analysis of the Local Composition in Solid Alloys
This paper reports on a novel approach to quantitatively reconstruct the number and the three-dimensional distribution of guest atoms inside a host matrix by a Scanning Transmission Electron Microscopy High Angle Annular Dark Field technique. Since the position of the guest atoms in the column strongly affects the chemical quantification for each column [1][2] this technique allows in addition ...
متن کاملScanning transmission electron microscopy at high resolution.
We have shown that a scanning transmission electron microscope with a high brightness field emission source is capable of obtaining better than 3 A resolution using 30 to 40 keV electrons. Elastic dark field images of single atoms of uranium and mercury are shown which demonstrate this fact as determined by a modified Rayleigh criterion. Point-to-point micrograph resolution between 2.5 and 3.0 ...
متن کاملAberration-corrected scanning transmission electron microscopy of semiconductors
The scanning transmission electron microscope (STEM) has been able to image individual heavy atoms in a light matrix for some time. It is now able to do much more: it can resolve individual atoms as light as boron in monolayer materials; image atomic columns as light as hydrogen, identify the chemical type of individual isolated atoms from the intensity of their annular dark field (ADF) image a...
متن کاملSize and Shape of Nanoclusters: Single-Shot Imaging Approach
A method of single-shot imaging via aberration-corrected scanning transmission electron microscopy equipped with high angle annular dark-field detector (STEM-HAADF) has been applied to size-selected gold model catalysts (Au(25) and Au(39) ) on hydroxyapatite. Through quantitative intensity analysis, the size, in terms of number of atoms as well as 3D shape of the clusters are obtained.
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- Proceedings of the National Academy of Sciences of the United States of America
دوره 68 12 شماره
صفحات -
تاریخ انتشار 1971