A Tool for Single-Fault Diagnosis in Linear Analog Circuits with Tolerance Using the T-Vector Approach

In previous works a technique for doing single fault diagnosis in linear analog circuits was developed. Under certain conditions, one of them being exact circuit parameters, it was shown that only two measurements taken on two selected circuit nodes, at a single frequency, were needed to detect and diagnose any parametric fault. In this paper, the practical value of the technique is evaluated by extending it to the diagnosis of faults in circuits with parameters subject to tolerance. With this in mind, single parametric faults of different strenghts are randomly injected in the circuit under study and, afterwards, these are diagnosed (or the diagnosis fails...). Results are reported on an active filter. Conclusions are drawn on the robustness and effectiveness of the technique.