A Dedicated In-situ Off-axis Electron Holography (S)TEM: Concept and Electron-Optical Performance
نویسندگان
چکیده
The progress in (scanning) transmission electron microscopy has led to an unprecedented knowledge of the microscopic structure of functional materials at the atomic level. Additionally, although not widely used yet, electron holography is capable to map the electric and magnetic potential distributions at the sub-nanometer scale. Nevertheless, in-situ studies inside a (scanning) transmission electron microscope ((S)TEM) are extremely challenging. Here, we introduce a concept for a dedicated in-situ (S)TEM with a large sample chamber for flexible multi-stimuli experimental setups and report about the electron optical performance of the instrument.
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