an overview of scanning near-field optical microscopy in characterization of nano-materials
نویسندگان
چکیده
scanning near-field optical microscopy (snom) is a member of scanning probe microscopes (spms) family which enables nanostructure investigation of the surfaces on a wide range of materials. in fact, snom combines the spm technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. in this paper, a qualified overview of diverse snom methods mostly based on aperture and aperture-less is presented.
منابع مشابه
An overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملScanning near-field optical microscopy.
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عنوان ژورنال:
international journal of nano dimensionجلد ۵، شماره Issue ۳، صفحات ۲۰۳-۲۱۲
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