Yet Another Hydrodynamic Model with Correlated Parameters for Silicon Devices
نویسندگان
چکیده
منابع مشابه
Uncertainty quantification of silicon photonic devices with correlated and non-Gaussian random parameters.
Process variations can significantly degrade device performance and chip yield in silicon photonics. In order to reduce the design and production costs, it is highly desirable to predict the statistical behavior of a device before the final fabrication. Monte Carlo is the mainstream computational technique used to estimate the uncertainties caused by process variations. However, it is very ofte...
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ژورنال
عنوان ژورنال: Microelectronics and Solid State Electronics
سال: 2013
ISSN: 2324-643X
DOI: 10.5923/j.msse.20120105.03