X-ray reflectivity of a Langmuir monolayer on water
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X-ray reflectivity of a Langmuir monolayer on water
2014 We built a special Langmuir through allowing the use of X-ray reflectivity. Using the device we studied for the first time the density profile of a Langmuir monolayer directly on water. This experiment opens new prospects in particular to measure the roughness of solid films on water subphase. Revue Phys. Appl. 22 .(1987) 775-778 AOÛT 1987,
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ژورنال
عنوان ژورنال: Revue de Physique Appliquée
سال: 1987
ISSN: 0035-1687
DOI: 10.1051/rphysap:01987002208077500