X-Ray Microscopy and X-Ray Microanalysis

X-ray deconvolution microscopy.

Recent advances in single-photon-counting detectors are enabling the development of novel approaches to reach micrometer-scale resolution in x-ray imaging. One example of such a technology are the MEDIPIX3RX-based detectors, such as the LAMBDA which can be operated with a small pixel size in combination with real-time on-chip charge-sharing correction. This characteristic results in a close to ...

Photoelectron X-ray Microscopy

The soft-X ray range, between 1-10 nm wavelength, is highly interesting for X-ray microscopy. Taking advantage of it requires, however, to operate a high resolution instrument at a variable wavelength. We describe here an image converter X-ray microscope which is based on secondary pharoemission. This instrument is now developped at the Institut dlOptique (Orsay); it will be installed near ACO ...

X-Ray microanalysis of stratified specimens

This paper presents a description of the state of the art methodology and software for the application of x-ray microanalysis to thin surface layers and more generally to the characterization of stratified specimens. The sensitivity of the technique to near-surface segregation is demonstrated. Some emphasis is given on the eS(pz) function (the distribution in depth of the primary generated x-ra...

X-ray microanalysis attachment for electron microscope.

Fundamental Constants for Quantitative X-ray Microanalysis.

Quantitative X-ray microanalysis requires the use of many fundamental constants related to the interaction of the electron beam with the sample. The current state of our knowledge of such constants in the particular areas of electron stopping power, X-ray ionization cross-sections, X-ray fluorescence yield, and the electron backscattering yield, is examined. It is found that, in every case, the...