Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy
نویسندگان
چکیده
منابع مشابه
Practical aspects of Kelvin probe force microscopy
We discuss practical aspects of Kelvin probe force microscopy ~KFM! which are important to obtain stable images of the electric surface potential distribution at high spatial resolution ~,100 nm! and high potential sensitivity ~,1 mV! on conducting and nonconducting samples. We compare metal-coated and semiconducting tips with respect to their suitability for KFM. Components of the metal coatin...
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Conventional closed loop-Kelvin probe force microscopy (KPFM) has emerged as a powerful technique for probing electric and transport phenomena at the solid-gas interface. The extension of KPFM capabilities to probe electrostatic and electrochemical phenomena at the solid-liquid interface is of interest for a broad range of applications from energy storage to biological systems. However, the ope...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2016
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.4940891