Vibration of a U-bar Perpendicular to its Plane
نویسندگان
چکیده
منابع مشابه
In-Plane and out of Plane Free Vibration of U-Shaped AFM Probes Based on the Nonlocal Elasticity
Atomic force microscope (AFM) has been developed at first for topography imaging; in addition, it is used for characterization of mechanical properties. Most researches have been primarily focused on rectangular single-beam probes to make vibration models simple. Recently, the U-shaped AFM probe is employed to determine sample elastic properties and has been developed to heat samples locally. I...
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ژورنال
عنوان ژورنال: Transactions of the Japan Society of Mechanical Engineers
سال: 1963
ISSN: 0029-0270,2185-9485
DOI: 10.1299/kikai1938.29.1725