Vehicle Components Defect Detection via Machine Vision
نویسندگان
چکیده
منابع مشابه
Machine vision for defect detection on silicon wafers
For several real-world problems, the mathematical methods of signal and image processing are most successful when they also incorporate the insight offered by the physics of the problem. Imaging systems are a particularly fertile ground for problems in this class because they deal specifically with the capture of physical scenes and with the reproduction of images on physical devices. Solutions...
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ژورنال
عنوان ژورنال: Mathematical Problems of Computer Science
سال: 2020
ISSN: 2579-2784
DOI: 10.51408/1963-0067