Valence and conduction band offsets of β-Ga2O3/AlN heterojunction

Band offsets at the GaInP/GaAs heterojunction

Rights: © 1997 American Institute of Physics. This is the accepted version of the following article: Lindell, A. & Pessa, M. & Salokatve, A. & Bernardini, F. & Nieminen, Risto M. & Paalanen, M. 1997. Band offsets at the GaInP/GaAs heterojunction. Journal of Applied Physics. Volume 82, Issue 7. 3374-3380. ISSN 0021-8979 (printed). DOI: 10.1063/1.365650, which has been published in final form at ...

Determination of band offsets at GaN/single-layer MoS2 heterojunction

Small valence-band offsets at GaN/InGaN heterojunctions

The band discontinuities between GaN and InN, as well as InGaN alloys, are key parameters for the design of nitride-based light emitters. Values reported to date are subject to large uncertainties due to strain effects at this highly mismatched interface. We have investigated the band lineups using first-principles calculations with explicit inclusion of strains and atomic relaxations at the in...

Measurement of band offsets in Si/Si12xGex and Si/Si12x2yGexCy heterojunctions

Realization of group IV heterostructure devices requires the accurate measurement of the energy band offsets in Si/Si12xGex and Si/Si12x2yGexCy heterojunctions. Using admittance spectroscopy, we have measured valence-band offsets in Si/Si12xGex heterostructures and conduction-band and valence-band offsets in Si/Si12x2yGexCy heterostructures grown by solid-source molecular-beam epitaxy. Measured...

Valence band offset of wurtzite InN/SrTiO3 heterojunction measured by x-ray photoelectron spectroscopy

The valence band offset (VBO) of wurtzite indium nitride/strontium titanate (InN/SrTiO3) heterojunction has been directly measured by x-ray photoelectron spectroscopy. The VBO is determined to be 1.26 ± 0.23 eV and the conduction band offset is deduced to be 1.30 ± 0.23 eV, indicating the heterojunction has a type-I band alignment. The accurate determination of the valence and conduction band o...