Two-dimensional stitching interferometry based on tilt measurement

Parallel Stitching of Two-Dimensional Materials

Two-dimensional Nanolithography Using Atom Interferometry

We propose a novel scheme for the lithography of arbitrary, two-dimensional nanostructures via matter-wave interference. The required quantum control is provided by a /2/2 atom interferometer with an integrated atom lens system. The lens system is developed such that it allows simultaneous control over atomic wave-packet spatial extent, trajectory, and phase signature. We demonstrate arbitrary ...

A Three-Dimensional Position Measurement Method Using Two Pan-Tilt Cameras

We have developed a 3D measuring system that uses two pan-tilt cameras to accurately measure the position of a robot’s hand. With this system, a target is set up at the tip of the robot’s hand. The pan-tilt cameras are controlled so that the midpoint of the target view is centered within the camera frames. Then, its 3D position is calculated using a triangulation method from the azimuth and ele...

Hyperspectral interferometry for single-shot absolute measurement of two-dimensional optical path distributions

We propose a method that we call Hyperspectral Interferometry (HSI) to resolve the 2 phase unwrapping problem in the analysis of interferograms recorded with a narrow-band light source. By using a broad-band light source and hyperspectral imaging system, a set of interferograms at different wavenumbers are recorded simultaneously on a high resolution image sensor. These are then assembled to f...

Surface Roughness Profile Measurement Based on Microscopic Shearing Interferometry

Surface roughness is an important feature of engineering surfaces. For surface roughness profile measurement, most of the exiting methods [1-6] would require isolated conditions to reduce the effect of base vibrations. The scattering interference method [7-8], based on a statistical algorithm together with comparison, may be used in a production environment, but the accuracy and reliability are...