The valence band alignment at ultrathin SiO2/Si interfaces
نویسندگان
چکیده
منابع مشابه
Interpretation of valence band photoemission spectra at organic-metal interfaces
L. Giovanelli,1 F. C. Bocquet,1,2 P. Amsalem,3 H.-L. Lee,4,5 M. Abel,1 S. Clair,1 M. Koudia,1 T. Faury,1 L. Petaccia,6 D. Topwal,6 E. Salomon,7 T. Angot,7 A. A. Cafolla,4 N. Koch,3 L. Porte,1 A. Goldoni,6 and J.-M. Themlin1 1Aix-Marseille Université, CNRS, IM2NP UMR 7334, 13397 Marseille, France 2Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany 3Humboldt-Universi...
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ژورنال
عنوان ژورنال: Journal of Applied Physics
سال: 1997
ISSN: 0021-8979,1089-7550
DOI: 10.1063/1.363895