Test set compaction algorithms for combinational circuits
نویسندگان
چکیده
منابع مشابه
Test set compaction for combinational circuits
Test set compaction for combinational circuits is studied in this paper. Two active compaction methods based on essential faults are developed to reduce a given test set. The special feature is that the given test set will be adaptly renewed to increase the chance of compaction. In the first method, forced pair-merging, pairs of patterns are merged by modifying their incompatible specified bits...
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ژورنال
عنوان ژورنال: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
سال: 2000
ISSN: 0278-0070
DOI: 10.1109/43.856980