Techniques for SAT-based constrained test pattern generation
نویسندگان
چکیده
منابع مشابه
SAT-based Automatic Test Pattern Generation
Due to the rapidly growing size of integrated circuits, there is a need for new algorithms for Automatic Test Pattern Generation (ATPG). While classical algorithms reach their limit, there have been recent advances in algorithms to solve Boolean Satisfiability (SAT). Because Boolean SAT solvers are working on Conjunctive Normal Forms (CNF), the problem has to be transformed. During transformati...
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ژورنال
عنوان ژورنال: Microprocessors and Microsystems
سال: 2013
ISSN: 0141-9331
DOI: 10.1016/j.micpro.2012.09.010