Synchronous motion of two vertically excited planar elastic pendula
نویسندگان
چکیده
منابع مشابه
Elastic property of vertically aligned nanowires.
An atomic force microscopy (AFM) based technique is demonstrated for measuring the elastic modulus of individual nanowires/nanotubes aligned on a solid substrate without destructing or manipulating the sample. By simultaneously acquiring the topography and lateral force image of the aligned nanowires in the AFM contacting mode, the elastic modulus of the individual nanowires in the image has be...
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ژورنال
عنوان ژورنال: Communications in Nonlinear Science and Numerical Simulation
سال: 2013
ISSN: 1007-5704
DOI: 10.1016/j.cnsns.2012.12.030