Structure–property relations between silicon-containing polyimides and their carbon-containing counterparts
نویسندگان
چکیده
منابع مشابه
Morphology and Resistivity of Cvd Polycrystalline Silicon Layers Containing Carbon
The influence of the addition of carbon on the crystalline structure and resistivity of polycrystalline silicon layers grown by simultaneous decomposition of SiH,, C^H. a n d P H T a t '°"° c w a s studied. Carbon content, morphology, preferred orientation, crystallite size, lattice strains and resistivity were determined. It was found that carbon has a pronounced effect on the crystalline stru...
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ژورنال
عنوان ژورنال: Molecular Simulation
سال: 2008
ISSN: 0892-7022,1029-0435
DOI: 10.1080/08927020802301888