Single Step 2-Port Device De-Embedding Algorithm for Fixture-DUT-Fixture Network Assembly

The de-embedding of measurement fixtures is relevant for an accurate experimental characterization radio frequency and digital electronic devices. standard technique consists in removing the effects by calculation transfer scattering parameters (T-parameters) from available measured (or simulated) global (S-parameters). achieved a multiple steps process, involving S-to-T subsequent T-to-S parameter conversion. In typical setup, two are usually placed before after device under test (DUT) allowing connection to calibrated vector network analyzer coaxial ports. An alternative method proposed this paper: it based on newly developed multi-network cascading algorithm. matrices involved fixture-DUT-fixture gives rise non-linear set equations that one step analytically solved closed form, obtaining unique solution. shown be effective at least as multi-step one.