Single and Multiple Ramp Progressive Stress with Binomial Removal: Practical Application for Industry

The objective of this article is to conduct a full study on the failure times items when subjected progressive-stress accelerated life test. These follow Modified Kies exponential distribution. We performed experiments under type-II censoring scheme with binomial removal. stress design has two ways be applied either simple ramp-stress test or multiple level acceleration. made comparison between these designs decide which better. When lifetime units follows distributions, cumulative exposure model been used apply acceleration produce early failures. simulation was done compare types designs. Different estimation techniques such as maximum likelihood and Bayes are employed estimate parameters. Metropolis Hasting method derive Bayesian estimates symmetric asymmetric loss functions. also developed interval well point estimation, we estimated asymptotic confidence intervals, bootstrap, credible for distribution different methods. real data from practical experiment set example assess performance estimations analyzed demonstrate adequacy superiority fit times. Also, studied existence uniqueness roots graphs assure that unique global maximum. Finally, some noteworthy conclusions reached.