Simulation of DIBL effect in junctionless SOI MOSFETs with extended gate

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Comparison of Single-Gate SOI & Multi-Gate SOI MOSFETs

This article presents the comparison of SingleGate SOI and Multi-Gate SOI MOSFETs. In the first part we have presented two main fundamental problems of the “ultimate” (sub-10-nm) MOSFET scaling of Single-Gate geometry: the exponential growth of power consumption and sensitivity to fabrication uncertainties. These factors have played the decisive role in for eventual transfer of the CMOS industr...

متن کامل

SEU sensitivity of Junctionless Single-Gate SOI MOSFETs-based 6T SRAM cells investigated by 3D TCAD simulation

Article history: Received 25 May 2015 Received in revised form 20 June 2015 Accepted 24 June 2015 Available online xxxx

متن کامل

The Effect of Gate Length on SOI-MOSFETs Operation

The effect of gate length on the operation of silicon-on-insulator (SOI) MOSFET structure with a layer of buried silicon oxide added to isolate the device body has been simulated. Three transistors with gate lengths of 100, 200 and 500 nm are simulated. Simulations show that with a fixed channel length, when the gate length is increased, the output drain current characteristics slope is increas...

متن کامل

Ultimately Thin Double-Gate SOI MOSFETs

The operation of 1–3 nm thick SOI MOSFETs, in double-gate (DG) mode and single-gate (SG) mode (for either front or back channel), is systematically analyzed. Strong interface coupling and threshold voltage variation, large influence of substrate depletion underneath the buried oxide, absence of drain current transients, degradation in electron mobility are typical effects in these ultra-thin MO...

متن کامل

Compact Model for Multiple-Gate SOI MOSFETs

In this work we present compact modelling schemes, for the undoped nanoscale multiple-gate MOSFET, suitable for design and projection of these devices. The proposed models have a physical basis and assume well-tempered multiple-gate MOSFETs; i.e., transistors with small shortchannel effects. We have considered different transport models (drift-diffusion and quasi-ballistic models); each one is ...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Nanosystems: Physics, Chemistry, Mathematics

سال: 2017

ISSN: 2220-8054

DOI: 10.17586/2220-8054-2017-8-1-75-78