Scanning X-Ray Apparatus for Texture Mapping by Energy Dispersive Diffraction

Development of Fast Texture Mapping System with Energy Dispersive X-ray Diffraction Method

Texture mapping system with energy dispersive X-ray diffraction method has been newly developed. Total time of measurement was reduced more than half by the adoption of a fast data transmission interface. Some examples are demonstrated in order to show the performance of the system. This approach is suitable for the study of local inhomogeneities of texture, such as colonies, in polycrystalline...

Energy-dispersive X-ray diffraction using an annular beam.

We demonstrate material phase identification by measuring polychromatic diffraction spots from samples at least 20 mm in diameter and up to 10 mm thick with an energy resolving point detector. Within our method an annular X-ray beam in the form of a conical shell is incident with its symmetry axis normal to an extended polycrystalline sample. The detector is configured to receive diffracted flu...

Three-dimensional diffraction mapping by tuning the X-ray energy

Three-dimensional reciprocal-space maps of a single SiGe island around the Si(004) Bragg peak are recorded using an energy-tuning technique with a microfocused X-ray beam with compound refractive lenses as focusing optics. The map is in agreement with simulated data as well as with a map recorded by an ordinary rocking-curve scan. The energy-tuning approach circumvents both the comparatively la...

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...

High temperature X-ray diffraction apparatus.