Scanning reflection ion microscopy in a helium ion microscope
نویسندگان
چکیده
منابع مشابه
Scanning reflection ion microscopy in a helium ion microscope
Reflection ion microscopy (RIM) is a technique that uses a low angle of incidence and scattered ions to form an image of the specimen surface. This paper reports on the development of the instrumentation and the analysis of the capabilities and limitations of the scanning RIM in a helium ion microscope (HIM). The reflected ions were detected by their "conversion" to secondary electrons on a pla...
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متن کاملScanning Ion Conductance Microscopy
Scanning ion conductance microscopy (SICM) is an imaging technique, measuring conductance through a nanometer-sized pipette tip opening that is brought close to a sample surface submerged in electrolyte solution. In combination with an integrated shear force distance control, the local ion conductance can be measured independently of and simultaneously with topography. The design of a shear-fo...
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ژورنال
عنوان ژورنال: Beilstein Journal of Nanotechnology
سال: 2015
ISSN: 2190-4286
DOI: 10.3762/bjnano.6.114