Scanning force microscope forin situnanofocused X-ray diffraction studies
نویسندگان
چکیده
منابع مشابه
Scanning force microscope for in situ nanofocused X-ray diffraction studies
A compact scanning force microscope has been developed for in situ combination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The new in situ device allows for in situ imaging the sample topography and the crystallinity by recording simultaneously an atomic force microsc...
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ژورنال
عنوان ژورنال: Journal of Synchrotron Radiation
سال: 2014
ISSN: 1600-5775
DOI: 10.1107/s1600577514014532